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Exhibitors Products Exhibit Profile Application Field Floor Plan

Dual point sensor 2 DPS

Industry category：
Infrared Applications
Product range：
Testing and Manufacturing Equipment,Testing and Manufacturing Equipment
Application field：
Semiconductor Processing & Manufacturing,Sensing & Measurement
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Product Presentation:

Wafer thickness measurement of non-transparent wafers. Precitec Optronik offers a stand-alone solution that enables non-contact thickness measurement of non-transparent components in both inline and offline production processes. Utilizing the geometry of the structure, the thickness of an object is calculated internally in the CHRocodile 2 DPS using the distance data to the two surfaces and provided directly to the user as a measurement signal.

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